Electrostatic discharge (ESD) is a major reliability concern for integrated circuit (IC) designs. ESD verification is proving to be a significant challenge at advanced nodes, due to growing IC design ...
AUSTIN, Texas--(BUSINESS WIRE)--The Silicon Integration Initiative Compact Model Coalition is proud to announce the release of the ASM-ESD diode model, a new electrostatic discharge compact modeling ...
Of all of the component-level ESD tests available, the charged-device model (CDM) test is the closest to simulating real world events. CDM testing simulates ESD charging followed by a rapid discharge, ...
An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, especially from the completion of the silicon wafer processing to when the device is assembled ...
SAN JOSE, Calif.--(BUSINESS WIRE)--Apache Design Solutions, the technology leader in power integrity and noise closure for chip-package-systems (CPS) convergence, today announced PathFinder™, a ...
When it comes to large system-on-chip (SoC) designs, there is a need for a comprehensive electrostatic discharge (ESD) verification flow that can verify both topological and geometrical constructions ...
At our company, we used failure analysis (FA) to successfully determine what caused GaAs RF ICs to fail during retesting. In our case, the source of the damage turned out to be just as important as ...
San Jose, Calif. – May 10, 2010 – Apache Design Solutions, the technology leader in power integrity and noise closure for chip-package-systems (CPS) convergence, today announced PathFinder™, a ...
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