ESD events that damage semiconductor devices come from people, from handlers and sorters, or from a device itself if it obtains sufficient static charge. ESD circuit designers add protection circuits ...

“This paper analyzes TCAD ESD simulation for both HBM zapping using real-world HBM ESD waveforms as stimuli and TLP testing using square wave TLP pulse trains as stimuli. It concludes that TCAD ESD ...

ECN magazine has a good article about transmission line pulse testing to establish ESD resistance of your circuits. This is analogous to time domain reflectometry that I wrote about in a feature ...